The Effect of Electric Field Distributions on Mixture Dielectric Loads by Using Electrode Plate for Pests Controls in Agriculture
Samran Santalunai, Chanchai Thongsopa, and Thanaset Thosdeekoraphat
School of Electronic Engineering, Suranaree University of Technology, 111 University Avenue, Muang District, Nakorn Ratchasima 30000, Thailand
Abstract—This research was conducted to analyze the effect of electric field distribution on mixture dielectric loads by using power ports on electrode plate for pest’s controls in agriculture. The electric fields were caused by the electric power on electrode plates to improve the electric field of dielectric loads. The dielectric loads of the rice and rice weevils were the target dielectric materials for analyzing the electric field distribution. To investigate the difference of electric power on heating predicted by the theoretical model, the electric field distributions were analyzed by using the finite difference time domain method. Theoretical and experimental investigations were carried out using dielectric load. The results demonstrated that the effect of the dielectric heating, the excitation source in symmetriclly was appropriate to the applications for the dielectric heating to cover the active area of heating. The advantage of the method is being able to be utilized for the dielectric heating applications to eliminate insects in the future.
Index Terms—dielectric heating, dielectric load, power ports, electrode plate
Cite: Samran Santalunai, Chanchai Thongsopa, and Thanaset Thosdeekoraphat, "The Effect of Electric Field Distributions on Mixture Dielectric Loads by Using Electrode Plate for Pests Controls in Agriculture," International Journal of Electronics and Electrical Engineering, Vol. 4, No. 4, pp. 305-308, August 2016. doi: 10.18178/ijeee.4.4.305-308
Cite: Samran Santalunai, Chanchai Thongsopa, and Thanaset Thosdeekoraphat, "The Effect of Electric Field Distributions on Mixture Dielectric Loads by Using Electrode Plate for Pests Controls in Agriculture," International Journal of Electronics and Electrical Engineering, Vol. 4, No. 4, pp. 305-308, August 2016. doi: 10.18178/ijeee.4.4.305-308
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