Improving the Performance of Fading Channel Simulators Using New Parameterization Method
Omar Alzoubi and Mohieldin Wainakh
Department of Communication Engineering, High Institute of Applied Sciences and Technology, Damascus, Syria
Abstract—The modeling and simulation of mobile fading channels can be done efficiently by using the finite sum of weighted sinusoids with equally distributed phases known as the concept of Rice method. In this paper, we evaluate the statistical properties of Weibull-lognormal fading channel model, such as Level Crossing Rate (LCR), Average Duration of Fades (ADF), and Probability Density Function (PDF). Several results are obtained by using different methods to design the deterministic simulation model parameters. New computation method of deterministic simulation model parameters is presented. This procedure is a combination of two methods, Method of Equal Areas and Method of Exact Doppler Spread. It is called a combination of MEA and MEDS. Comparisons between Autocorrelation Functions (ACFs) of both reference and simulation models are introduced for different methods. It is demonstrated by several simulation results that statistical properties of simulation and reference models will be much closer according to the new method than MEDS and MEA. Finally, the results indicate the superiority of the new method over the MEDS and MEA with respect to LCR and ADF of Weibull-lognormal fading channel model.
Index Terms—level crossing rate, average duration of fades, autocorrelation functions
Cite: Omar Alzoubi and Mohieldin Wainakh, "Improving the Performance of Fading Channel Simulators Using New Parameterization Method," International Journal of Electronics and Electrical Engineering, Vol. 4, No. 5, pp. 443-448, October 2016. doi: 10.18178/ijeee.4.5.443-448
Cite: Omar Alzoubi and Mohieldin Wainakh, "Improving the Performance of Fading Channel Simulators Using New Parameterization Method," International Journal of Electronics and Electrical Engineering, Vol. 4, No. 5, pp. 443-448, October 2016. doi: 10.18178/ijeee.4.5.443-448
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