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The Study of Deficiency of IEC Flickermeter Regarding the Interharmonic-Caused Voltage Flicker

Chia-Te Lin, Cheng-Yu Tsai, Chen-Ting Kao, and Chau-Shing Wang
Department of Electrical Engineering, National Changhua University of Education, Changhua, Taiwan
Abstract—The bad power quality may cause the machine malfunction or the damage of the machine. Therefore, the IEC 61000-4-15 is proposed by International Electrotechnical Commission for voltage flicker measurement. Moreover, the short-term flicker severity and long-term flicker severity are defined to estimate the level of voltage flicker. However, the IEC standard cannot measure the voltage flicker caused by interharmonics. The flicker caused by the interharmonic frequency higher than 102Hz and lower than 18Hz cannot be evaluated because the bandpass filter of IEC standard will filter them out. In the study, a series of filters are built for the interharmonic components, and the short-term flicker severity value will be calculated based on the envelope of the voltage fluctuation obtained by the half-wave RMS method.
 
Index Terms—IEC 61000-4-15, interharmonic, half-cycle RMS value, band pass filter bank

Cite: Chia-Te Lin, Cheng-Yu Tsai, Chen-Ting Kao, and Chau-Shing Wang, "The Study of Deficiency of IEC Flickermeter Regarding the Interharmonic-Caused Voltage Flicker," International Journal of Electronics and Electrical Engineering, Vol. 5, No. 5, pp. 297-300, October 2017. doi: 10.18178/ijeee.5.5.297-300
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