Design and Automatic System Verification of Digital Baseband for UHF RFID Tag
Ji-Ting Su, Zheng Xie, Xin-An Wang, and Ying Cao
The Key Lab of Integrated Microsystems,
Peking University Shenzhen Graduate School, Shenzhen, China
Abstract—This paper presents the design and automatic system verification of digital baseband for Ultra High Frequency (UHF) radio frequency identification (RFID) tag, which is complied with a modified ISO 18000-6C protocol. Module-reuse approach and low power techniques are applied in the digital baseband to reduce the power consumption. And a novel verification strategy is discussed, which decreases the verification cycle greatly via function test mode and coverage test mode, and generates testcases automatically by using coverage-driven random-based approach. The strategy has many merits, such as a hierarchical architecture for reuse, inspecting low power design though assertion, locating bugs accurately, and linking C++ via direct programming interface (DPI). The tag chip is designed in a 0.18um CMOS process with a size of 89234 um2. Simulation results verify the efficiency of the proposed methods.
Index Terms—RFID passive tag baseband, automatic system verification, coverage-driven random-based approach, SystemVerilog, DPI
Cite: Ji-Ting Su, Zheng Xie, Xin-An Wang, and Ying Cao, "Design and Automatic System Verification of Digital Baseband for UHF RFID Tag," International Journal of Electronics and Electrical Engineering, Vol. 1, No. 3, pp. 130-134, September 2013. doi: 10.12720/ijeee.1.3.130-134
Index Terms—RFID passive tag baseband, automatic system verification, coverage-driven random-based approach, SystemVerilog, DPI
Cite: Ji-Ting Su, Zheng Xie, Xin-An Wang, and Ying Cao, "Design and Automatic System Verification of Digital Baseband for UHF RFID Tag," International Journal of Electronics and Electrical Engineering, Vol. 1, No. 3, pp. 130-134, September 2013. doi: 10.12720/ijeee.1.3.130-134
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